![](/img/cover-not-exists.png)
The Application of Micro Area Analysis of Al-Cu Junction by Wavelength-Dispersive EPMA Equipped with a FE Electron Gun.
Kimura, T, Ogiwara, T, Fukushima, S, Tanuma, SVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606069078
Date:
August, 2006
File:
PDF, 160 KB
english, 2006