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A Different Kind of Microscopy: Analyzing Features with an Automated Electron Beam
Schamber, F, Beek, CK vanVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606069479
Date:
August, 2006
File:
PDF, 127 KB
english, 2006