Aberration-Corrected STEM - More than just Higher...

Microscopy and Microanalysis 2006 / 8 Vol. 12; Iss. S02

Aberration-Corrected STEM - More than just Higher Resolution

Pennycook, S, Chisholm, M, Lupini, A, Peng, Y, Varela, M, Benthem, K van, Borisevich, A, Jonge, N de, Oxley, M
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Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606069650
Date:
August, 2006
File:
PDF, 970 KB
english, 2006
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