Assembly and Analysis of Ordered Semiconductor Quantum Dot Arrays by Focused Ion Beam Nanofabrication and Tomography
Hull, R, Graham, J, Kubis, A, Portavoce, A, Ross, FVolume:
13
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927607072649
Date:
August, 2007
File:
PDF, 1.09 MB
english, 2007