Three Dimensional Compositional Characterization of Dielectric Films with LEAP Tomography
Ulfig, R, Thompson, K, Alvis, R, Larson, DJ, Ronsheim, PVolume:
13
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927607076568
Date:
August, 2007
File:
PDF, 344 KB
english, 2007