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In-situ Observation of Structural Change and Failure...

In-situ Observation of Structural Change and Failure Detection for Electrically Active Devices in TEM

Kim, Y-W, Ko, D-S, Kim, S-D, Li, XS, Park, GS, Kim, YK, Park, CG
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Volume:
13
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760707732x
Date:
August, 2007
File:
PDF, 337 KB
english, 2007
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