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Comparing Transmission Electron Microscopy (TEM) and Tomographic Atom Probe (TAP) through Measurements of Thin Multilayers
Heil, T, Stender, P, Schmitz, G, Kohl, HVolume:
13
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927607081998
Date:
September, 2007
File:
PDF, 614 KB
english, 2007