Misfit Dislocations in Ferroelectric Thin films
Arredondo, M, Chi, M, Saunders, M, Petraru, A, Nagarajan, V, Kohlstedt, H, Browning, NDVolume:
14
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927608082238
Date:
August, 2008
File:
PDF, 221 KB
english, 2008