Repetitive Grain Boundary Chemical Analysis by Atom Probe...

Microscopy and Microanalysis 2008 / 8 Vol. 14; Iss. S2

Repetitive Grain Boundary Chemical Analysis by Atom Probe Microscopy

Larson, DJ, Clifton, PH, Alvis, RL, Olson, DP, Weng, J, Gerstl, SA, Chen, F
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Volume:
14
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927608083220
Date:
August, 2008
File:
PDF, 1.81 MB
english, 2008
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