A New Paradigm for Ultra-High-Resolution Imaging at...

Microscopy and Microanalysis 2008 / 8 Vol. 14; Iss. S2

A New Paradigm for Ultra-High-Resolution Imaging at Elevated Temperatures

Allard, LF, Bigelow, WC, Nackashi, D, Damiano, J, Mick, SE
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Volume:
14
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927608086406
Date:
August, 2008
File:
PDF, 2.03 MB
english, 2008
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