Simple Method for Estimating Relaxation in Silicon from Higher Order Laue Zone Line Splitting
Diercks, DR, Kaufman, MJ, Needleman, AVolume:
14
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927608086923
Date:
August, 2008
File:
PDF, 1017 KB
english, 2008