Non-Contact 3D Surface Metrology of Large Grain High Purity Niobium by SLCM and FESEM
Sung, ZH, Lee, PJ, Larbalestier, DCVolume:
14
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927608087229
Date:
August, 2008
File:
PDF, 276 KB
english, 2008