3D Imaging of Si and Er Nanoclusters in Er Doped SiO1.5...

Microscopy and Microanalysis 2009 / 7 Vol. 15; Iss. S2

3D Imaging of Si and Er Nanoclusters in Er Doped SiO1.5 Films by STEM Tomography

Li, P, Wang, X, Malac, M, Egerton, R, Meldrum, A, Lenz, F, Liang, X, Wang, J
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609093143
Date:
July, 2009
File:
PDF, 332 KB
english, 2009
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