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Crystal Structure Analysis Using Annular Dark-Field Imaging with High Precision
Kimoto, K, Ishizuka, K, Saito, M, Nagai, T, Yu, X, Xie, R-J, Hirosaki, N, Matsui, YVolume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609093179
Date:
July, 2009
File:
PDF, 556 KB
2009