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Application of Low Accelerating Voltage Aberration Corrected Dedicated STEM With Cold FEG.
Konno, M, Suzuki, Y, Nakamura, K, Inada, HVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609093180
Date:
July, 2009
File:
PDF, 448 KB
english, 2009