Techniques for Consecutive TEM and Atom Probe Tomography...

Techniques for Consecutive TEM and Atom Probe Tomography Analysis of Nanowires

Diercks, D, Gorman, BP, Cheung, CL, Wang, G
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Volume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609093398
Date:
July, 2009
File:
PDF, 731 KB
2009
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