30 keV Ga+ FIB Induced X-Rays (FIBIX) of Conductive Materials
Giannuzzi, LA, Gorman, BPVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609093453
Date:
July, 2009
File:
PDF, 1.51 MB
english, 2009