Dislocation Analysis of Semiconductor Devices using 3D...

Dislocation Analysis of Semiconductor Devices using 3D Rotation Imaging Technique of Dedicated STEM

Back, TS, Lee, SJ, Jung, JW, Kim, JH, Kim, HJ
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609093660
Date:
July, 2009
File:
PDF, 628 KB
english, 2009
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