In-Situ Atomic-Resolution Study of Stress-Induced Unusual...

In-Situ Atomic-Resolution Study of Stress-Induced Unusual Large Strain Plasticity of Semiconductor nanowires

Zhang, Z, Han, X
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609093763
Date:
July, 2009
File:
PDF, 8.87 MB
english, 2009
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