Accurate Quantitative EDS Mapping at High Count Rates with...

Accurate Quantitative EDS Mapping at High Count Rates with a Large Area Silicon Drift Detector

Collins, CL, Holland, J, Burgess, SR, Statham, P, Rowlands, N
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Volume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609093921
Date:
July, 2009
File:
PDF, 201 KB
2009
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