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Evaluation of Strategies to Increase the Spatial Resolution of X-Ray Mapping in the FE-SEM of Low Concentration in Sub-Micron microstructures
Hovington, P, T-Pinard, P, Lagacé, M, Thibeault, D, Gauvin, R, Drouin, DVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609093994
Date:
July, 2009
File:
PDF, 641 KB
english, 2009