Spatially Resolved Characterization of Interface Plasmons...

Spatially Resolved Characterization of Interface Plasmons in Si/SiO2 Core/Shell Nanostructures

Wang, J, Wang, X, Jiao, Y, Li, Q, Chu, M-W, Malac, M
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Volume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760909401x
Date:
July, 2009
File:
PDF, 688 KB
2009
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