![](/img/cover-not-exists.png)
Review of Atom Probe Tomography Applications for Semiconductor materials
Renaud, L, Martin, I, Salle, B, Benbalagh, R, Davis, A, Schuhmacher, MVolume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609094343
Date:
July, 2009
File:
PDF, 587 KB
2009