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A Users Perspective of Remote TEM
Brown, G, Bons, A-J, Balen, A van, Anthonis, M, Stuyver, J, Rocker, S de, Levulis, M, Estrada, E, Wapp, S, Butler, JVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609094720
Date:
July, 2009
File:
PDF, 198 KB
english, 2009