![](/img/cover-not-exists.png)
Microstructural Characterization of Sputter Deposited BaTiO3/Ni/BaTiO3/Ni/BaTiO3 Multi-layer Thin Films on SiO2/Si Wafers
Zhang, M, Reck, JN, Miller, FS, O'Keefe, MJVolume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760909477x
Date:
July, 2009
File:
PDF, 197 KB
2009