An Improved Large Area Silicon Drift Detector EDS System for Low Energy X-ray Detection and Fast Spectrum Imaging
Feng, L, Saveliev, VD, Takahashi, M, Tull, CR, Barkan, S, Damron, EV, Kosuge, S, Lamb, RD, Witherspoon, KC, Sjoman, POVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609095154
Date:
July, 2009
File:
PDF, 605 KB
english, 2009