XEDS with SDD-Technology in Scanning Transmission Electron...

Microscopy and Microanalysis 2009 / 7 Vol. 15; Iss. S2

XEDS with SDD-Technology in Scanning Transmission Electron Microscopy

Falke, M, Mogilatenko, A, Kirmse, H, Neumann, W, Brombacher, C, Albrecht, M, Bleloch, AL, Tränkle, G, Käppel, A, Terborg, R, Kroemer, R, Rohde, M
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609095270
Date:
July, 2009
File:
PDF, 1.15 MB
english, 2009
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