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Transitioning Laser Ablation ICP-MS from Research Applications to Routine Trace Element Microanalysis: A Look at Quantitative Trace Element Analyses and Imaging
Koenig, AEVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609095282
Date:
July, 2009
File:
PDF, 282 KB
english, 2009