Single Atom Detection by XEDS in the Aberration Corrected...

Single Atom Detection by XEDS in the Aberration Corrected AEM: Is it Feasible?,

Zaluzec, NJ
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609095646
Date:
July, 2009
File:
PDF, 412 KB
english, 2009
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