Atmospheric Electron Microscope: Limits of Observable Depth

Microscopy and Microanalysis 2009 / 7 Vol. 15; Iss. S2

Atmospheric Electron Microscope: Limits of Observable Depth

Suga, M, Nishiyama, H, Ebihara, T, Ogura, T, Sato, C
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609095774
Date:
July, 2009
File:
PDF, 3.00 MB
english, 2009
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