Precision, Double XTEM Sample Preparation of Site Specific...

Precision, Double XTEM Sample Preparation of Site Specific Si Nanowires

Gignac, LM, Mittal, S, Bangsaruntip, S, Cohen, GM, Sleight, JW
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Volume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609096159
Date:
July, 2009
File:
PDF, 949 KB
2009
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