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Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration
Chang, L-Y, Lazar, S, Bártová, B, Botton, GA, Hébert, C, Morral, A Fontcuberta iVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609096470
Date:
July, 2009
File:
PDF, 971 KB
english, 2009