Are Dislocations Present in Nanoparticles?: Fourier...

Are Dislocations Present in Nanoparticles?: Fourier Filtering of Images Obtained From In-Situ TEM Nanoindentation

Carlton, C, Ferreira, PJ
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609096585
Date:
July, 2009
File:
PDF, 800 KB
english, 2009
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