Quantitative Characterisation of Surface and Interface...

Quantitative Characterisation of Surface and Interface Chemistry with X-ray Photoelectron Spectroscopy (XPS)

Nunney, TS, Mustonen, O, White, RG
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609096615
Date:
July, 2009
File:
PDF, 256 KB
english, 2009
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