Spherical Aberration Corrected TEM/STEM Analysis of La2O3...

Microscopy and Microanalysis 2009 / 7 Vol. 15; Iss. S2

Spherical Aberration Corrected TEM/STEM Analysis of La2O3 Thin Film Deposited on Si (001) Substrate

Inamoto, S, Yamasaki, J, Okunishi, E, Kakushima, K, Iwai, H, Tanaka, N
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609096767
Date:
July, 2009
File:
PDF, 710 KB
english, 2009
Conversion to is in progress
Conversion to is failed