![](/img/cover-not-exists.png)
Focused Ion Beam as a Direct-write Mask Tool for Patterning Diamond
McKenzie, W, Pethica, J, Cross, GVolume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609096962
Date:
July, 2009
File:
PDF, 1.85 MB
2009