Focused Ion Beam as a Direct-write Mask Tool for Patterning...

Focused Ion Beam as a Direct-write Mask Tool for Patterning Diamond

McKenzie, W, Pethica, J, Cross, G
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Volume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609096962
Date:
July, 2009
File:
PDF, 1.85 MB
2009
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