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Scanning Transmission Electron Microscopy: The Major Beneficiary of Aberration Correction?
Bleloch, AL, Gass, M, Mendis, B, Sader, K, Schaffer, B, Wang, PVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609096974
Date:
July, 2009
File:
PDF, 360 KB
english, 2009