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Growth and Structural Characterization of Multiferroic Thin Films and Nanopatterns
Xie, S, Pan, Z, Cheng, J, Sterbinsky, G, Wessels, B, Dravid, VPVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609097050
Date:
July, 2009
File:
PDF, 270 KB
english, 2009