Correlative Microscopy: Progress in Simultaneous...

Correlative Microscopy: Progress in Simultaneous Atomic-column XEDS and EELS, using a Monochromated, Aberration-corrected STEM

Bell, DC, Schillinger, R, Meyer, S, Tayebati, P
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609097323
Date:
July, 2009
File:
PDF, 381 KB
english, 2009
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