In Situ and High Resolution TEM Studies of Nano-scale...

In Situ and High Resolution TEM Studies of Nano-scale Materials

Sinclair, R, Koh, AL, Kempen, P, Jung, HJ
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Volume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609097554
Date:
July, 2009
File:
PDF, 838 KB
2009
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