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Scanning Confocal Electron Microscopy in a FEI Double Corrected Titan3 TEM/STEM
Zaluzec, NJ, Weyland, M, Etheridge, JVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609097840
Date:
July, 2009
File:
PDF, 3.67 MB
english, 2009