Tomographic Characterization of Dislocations in Failure...

Tomographic Characterization of Dislocations in Failure Regions of Broad Area InGaAs/AlGaAs Strained Layer Single Quantum Well High Power Laser Diodes

Foran, B, Ives, N, Yeoh, T, Brodie, M, Sin, Y, Presser, N, Mason, M, Moss, S
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760909789x
Date:
July, 2009
File:
PDF, 463 KB
english, 2009
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