Reference Material (RM) 8820: A New Scanning Electron...

Reference Material (RM) 8820: A New Scanning Electron Microscope Scale Calibration Artifact

Vladár, AE, Postek, MT
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Volume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609097943
Date:
July, 2009
File:
PDF, 895 KB
2009
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