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Atom Probe Tomography Studies of GaN-Based Semiconductor Materials
Bennett, SE, Oliver, RA, Saxey, DW, Cerezo, A, Clifton, PH, Ulfig, R, Kappers, MJ, Humphreys, CJVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609097979
Date:
July, 2009
File:
PDF, 2.44 MB
english, 2009