![](/img/cover-not-exists.png)
Characterization of Dental Bonded Interface Degradation Using Focused Ion Beam and High-Resolution Transmission Electron Microscopy
Duarte, S, Avishai, A, Sadan, AVolume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609098031
Date:
July, 2009
File:
PDF, 1001 KB
2009