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TEM Characterization of Deformation and Failure Mechanisms in 40 nm and 5nm Cu/Nb Nanolayed Micro Compression Pillars
Mara, N, Bhattacharyya, D, Dickerson, P, Hoagland, R, Misra, AVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609098596
Date:
July, 2009
File:
PDF, 880 KB
english, 2009