Applications of Aberration-corrected TEM and STEM in...

Microscopy and Microanalysis 2009 / 7 Vol. 15; Iss. S2

Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

Lazar, S, Chang, L-Y, Gunawan, L, Shao, Y, Botton, GA
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609098663
Date:
July, 2009
File:
PDF, 1.15 MB
english, 2009
Conversion to is in progress
Conversion to is failed