Superior Imaging Quality of Scanning Helium-Ion Microscopy:...

Microscopy and Microanalysis 2009 / 7 Vol. 15; Iss. S2

Superior Imaging Quality of Scanning Helium-Ion Microscopy: a Look at Beam-Sample Interactions,

Cohen-Tanugi, D, Yao, N
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609098687
Date:
July, 2009
File:
PDF, 302 KB
2009
Conversion to is in progress
Conversion to is failed