Towards Low-Damage TEM Sample Preparation of Carbonaceous...

Microscopy and Microanalysis 2009 / 7 Vol. 15; Iss. S2

Towards Low-Damage TEM Sample Preparation of Carbonaceous Materials in the Focused Ion Beam

Bassim, N, Gregorio, B De, Kilcoyne, AD, Scott, K, Chou, T, Wirick, S, Cody, G, Fischione, PE, Liu, J, Stroud, R
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760909878x
Date:
July, 2009
File:
PDF, 335 KB
english, 2009
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