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Applications of High-Resolution Aberration-Corrected STEM Imaging to Studies of the Behavior of Nanophase Materials at Elevated Temperatures
Allard, LF, More, KL, Liu, JVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192760909895x
Date:
July, 2009
File:
PDF, 9.01 MB
english, 2009